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    Rapid analysis of temperature fields in electronic enclosures based on the finite difference thermal resistance network method

    Rapid analysis of temperature fields in electronic enclosures based on the finite difference thermal resistance network method by Xiaoyue Zhang, Yinmo Xie, Bing Liu, Yingze Meng, Kewei Sun, Guangsheng Wu, Jianyu Tan

    Published 2025-01-01
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