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Reliability analysis under bias stress and elevated temperature of dual-gate IGZO TFT by Jingxuan Wei, Nannan Li, Yu Zhang, Xuefeng Wu, Jiyuan Zhu, Rongxu Bai, Xin Chao, Wenrui Zhang, Li Ji, Qingqing Sun, David Wei Zhang, Shen Hu
Published 2024-11-01Get full text
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