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  1. 1
    CFET Beyond 3 nm: SRAM Reliability Under Design-Time and Run-Time Variability

    CFET Beyond 3 nm: SRAM Reliability Under Design-Time and Run-Time Variability by Sufia Shahin, Swati Deshwal, Anirban Kar, Mahdi Benkhelifa, Yogesh S. Chauhan, Hussam Amrouch

    Published 2025-01-01
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  2. 2
    Investigating Self-Heating Effects in Ferroelectric FinFETs for Reliable In-Memory Computing

    Investigating Self-Heating Effects in Ferroelectric FinFETs for Reliable In-Memory Computing by Swati Deshwal, Shubham Kumar, Swetaki Chatterjee, Anirban Kar, Shivendra Singh Parihar, Yogesh Singh Chauhan, Hussam Amrouch

    Published 2025-01-01
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