Showing 1 - 2 results of 2 for search 'Shivendra Kumar Singh', query time: 0.01s Refine Results
  1. 1
    Demonstration of Gate-Related Trap Characterization in 4H-SiC MOSFETs Using Gate Stress Leakage Current

    Demonstration of Gate-Related Trap Characterization in 4H-SiC MOSFETs Using Gate Stress Leakage Current by Shivendra Kumar Singh, Tian-Li Wu, Yogesh Singh Chauhan

    Published 2025-01-01
    Get full text
    Article
    Save to List
    Saved in:
  2. 2
    Demonstration of accurate ID-VG characteristics modeling in SiC mosfets using separated artificial neural networks with small training dataset

    Demonstration of accurate ID-VG characteristics modeling in SiC mosfets using separated artificial neural networks with small training dataset by Manopat Chankla, Bang-Ren Chen, Shivendra Kumar Singh, Yogesh Singh Chauhan, Wen-Jay Lee, Nan-Yow Chen, Songphol Kanjanachuchai, Tian-Li Wu

    Published 2025-05-01
    Get full text
    Article
    Save to List
    Saved in:

Search Tools: