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    Reliability of high-performance monolayer MoS2 transistors on scaled high-κ HfO2

    Reliability of high-performance monolayer MoS2 transistors on scaled high-κ HfO2 by Hao-Yu Lan, Shao-Heng Yang, Karim-Alexandros Kantre, Daire Cott, Rahul Tripathi, Joerg Appenzeller, Zhihong Chen

    Published 2025-01-01
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