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    Exhaustive characterization of modified Si vacancies in 4H-SiC

    Exhaustive characterization of modified Si vacancies in 4H-SiC by Davidsson Joel, Babar Rohit, Shafizadeh Danial, Ivanov Ivan G., Ivády Viktor, Armiento Rickard, Abrikosov Igor A.

    Published 2022-09-01
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