Showing 1 - 2 results of 2 for search 'Saed Al-Hajjawi', query time: 0.01s Refine Results
  1. 1
    Deep-Learning Based Depth-Tracking of Stacking-Faults in Epitaxially Grown Silicon Wafers

    Deep-Learning Based Depth-Tracking of Stacking-Faults in Epitaxially Grown Silicon Wafers by Theresa Trötschler, Saed Al-Hajjawi, Siddharth Raghavendran, Jonas Haunschild, Matthias Demant, Stefan Rein

    Published 2025-02-01
    Get full text
    Article
    Save to List
    Saved in:
  2. 2
    Inline Mapping of Amorphous Silicon Layer Thickness of Heterojunction Precursors Using Multispectral Imaging

    Inline Mapping of Amorphous Silicon Layer Thickness of Heterojunction Precursors Using Multispectral Imaging by Saravana Kumar, Christian Diestel, Saed Al-Hajjawi, Jurriaan Schmitz, Marc Hemsendorf, Jonas Haunschild, Stefan J. Rupitsch, Stefan Rein

    Published 2025-01-01
    Get full text
    Article
    Save to List
    Saved in:

Search Tools: