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    On the Applicability of HF and μ-PCD Methods for Determination of Carrier Recombination Lifetime in the Non-passivated Single-crystal Silicon Samples

    On the Applicability of HF and μ-PCD Methods for Determination of Carrier Recombination Lifetime in the Non-passivated Single-crystal Silicon Samples by I.М. Anfimov, S.P. Kobeleva, I.V. Schemerov, M.N. Orlova

    Published 2014-07-01
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