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    Author Correction: LSTM-based framework for predicting point defect percentage in semiconductor materials using simulated XRD patterns

    Author Correction: LSTM-based framework for predicting point defect percentage in semiconductor materials using simulated XRD patterns by Mehran Motamedi, Reza Shidpour, Mehdi Ezoji

    Published 2025-01-01
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  2. 2
    LSTM-based framework for predicting point defect percentage in semiconductor materials using simulated XRD patterns

    LSTM-based framework for predicting point defect percentage in semiconductor materials using simulated XRD patterns by Mehran Motamedi, Reza Shidpour, Mehdi Ezoji

    Published 2024-10-01
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