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    High‐Resolution and Surface‐Sensitive Tip‐Enhanced Raman Spectroscopy Characterization of Strained‐Silicon Devices through Cleanroom‐Compatible Plasmonic Probes

    High‐Resolution and Surface‐Sensitive Tip‐Enhanced Raman Spectroscopy Characterization of Strained‐Silicon Devices through Cleanroom‐Compatible Plasmonic Probes by Chiara Mancini, Anacleto Proietti, Giancarlo La Penna, Luca Buccini, Daniele Passeri, Narciso Gambacorti, Marco Rossi

    Published 2025-05-01
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