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    Corrigendum to “Numerical and experimental investigation of temperature dependence vs. mobility degradation on I–V characteristics in N-LDMOS structure” [Case Stud. Therm. Eng. (59), July 2024, 104515]

    Corrigendum to “Numerical and experimental investigation of temperature dependence vs. mobility degradation on I–V characteristics in N-LDMOS structure” [Case Stud. Therm. Eng. (59... by Mohammed Almatrafi, Mohamed Ali Belaïd

    Published 2025-02-01
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