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    Broadband S-Parameter-Based Characterization of Multilayer Ceramic Capacitors Submitted to Mechanical Stress Through Bending Tests on a PCB

    Broadband S-Parameter-Based Characterization of Multilayer Ceramic Capacitors Submitted to Mechanical Stress Through Bending Tests on a PCB by Victoria Gutiérrez-Vicente, Jesús Alejandro Torres-Torres, Reydezel Torres-Torres

    Published 2024-11-01
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