Revisiting the role of oxidation in stable and high-performance lead-free perovskite-IGZO junction field-effect transistors by Seonkwon Kim, Su Hyun Kim, Hui Ung Hwang, Jeongmin Kim, Jeong Won Kim, In Cheol Kwak, Byeongjae Kang, Seungjae Lee, Sae Byeok Jo, Du Yeol Ryu, Hyunjung Kim, Jae-Min Myoung, Moon Sung Kang, Saeroonter Oh, Jeong Ho Cho

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