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    Stress Analysis of the Interface Reaction Layer Between Ni–P Films and GaAs Substrate After Annealing

    Stress Analysis of the Interface Reaction Layer Between Ni–P Films and GaAs Substrate After Annealing by Koichiro NISHIZAWA, Ayumu MATSUMOTO, Yasuyuki NAKAGAWA, Hitoshi SAKUMA, Yoshiki KOJIMA, Naoki FUKUMURO, Shinji YAE

    Published 2024-12-01
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