Bayesian estimation to identify crystalline phase structures for X-ray diffraction pattern analysis by Ryo Murakami, Yoshitaka Matsushita, Kenji Nagata, Hayaru Shouno, Hideki Yoshikawa

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Bayesian inference for peak feature extraction and prediction of material property in X-ray diffraction data by Ryo Murakami, Taisuke T. Sasaki, Hideki Yoshikawa, Yoshitaka Matsushita, Keitaro Sodeyama, Tadakatsu Ohkubo, Hiroshi Shinotsuka, Kenji Nagata

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Exploring high-symmetry structures in non-Cartesian coordinates: preparation and characteristics of cylindrically symmetric-rotating crystals by Bo Da, Long Cheng, Xun Liu, Kunji Shigeto, Zihang Zhang, Kazuhito Tsukagoshi, Toshihide Nabatame, Zejun Ding, Jiangwei Liu, Hideki Yoshikawa, Shigeo Tanuma

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