Single- and multi-locus genome-wide association study reveals genomic regions of thirteen yield-related traits in common wheat by Yuxia Lv, Liansheng Dong, Xiatong Wang, Linhong Shen, Wenbo Lu, Fan Si, Yaoyao Zhao, Guanju Zhu, Yiting Ding, Shujun Cao, Jiajia Cao, Jie Lu, Chuanxi Ma, Cheng Chang, Haiping Zhang

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