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    A Statistical Approach for Characterizing the Behaviour of Roughness Parameters Measured by a Multi-Physics Instrument on Ground Surface Topographies: Four Novel Indicators

    A Statistical Approach for Characterizing the Behaviour of Roughness Parameters Measured by a Multi-Physics Instrument on Ground Surface Topographies: Four Novel Indicators by Clément Moreau, Julie Lemesle, David Páez Margarit, François Blateyron, Maxence Bigerelle

    Published 2024-11-01
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