Nondestructive Identification of Internal Potato Defects Using Visible and Short-Wavelength Near-Infrared Spectral Analysis by Dennis Semyalo, Yena Kim, Emmanuel Omia, Muhammad Akbar Andi Arief, Haeun Kim, Eun-Yeong Sim, Moon S. Kim, Insuck Baek, Byoung-Kwan Cho

Get full text