Process-Dependent Evolution of Channel Stress and Stress-Induced Mobility Gain in FinFET, Normal GAAFET, and Si/SiGe Hybrid Channel GAAFET by Chiang Zhu, Xiaona Zhu, Shaofeng Yu, David Wei Zhang

Get full text

A novel self-biased pMOS clamped deep trench CSTBT with enhanced tradeoff and short-circuit capability by Jianbin Guo, Zhehong Qian, Xinru Chen, Hang Xu, Yafen Yang, David Wei Zhang

Get full text

DC Characteristics Optimization of a Double G-Shield 50 V RF LDMOS by Xiangming Xu, Pengliang Ci, Xiaoyu Tang, Jing Shi, Zhengliang Zhou, Jingfeng Huang, Peng-Fei Wang, David Wei Zhang

Get full text

The Investigation of Field Plate Design in 500 V High Voltage NLDMOS by Donghua Liu, Xiangming Xu, Feng Jin, Wenting Duan, Huihui Wang, Jing Shi, Yuan Yao, Jun Hu, Wensheng Qian, Pengfei Wang, David Wei Zhang

Get full text

Design of a Novel W-Sinker RF LDMOS by Xiangming Xu, Han Yu, Jingfeng Huang, Chun Wang, Wei Ji, Zhengliang Zhou, Ying Cai, Yong Wang, Pingliang Li, Peng-Fei Wang, David Wei Zhang

Get full text

Effect of Lanthanum‐Aluminum Co‐Doping on Structure of Hafnium Oxide Ferroelectric Crystals by Zhenhai Li, Shuqi Tang, Tianyu Wang, Yongkai Liu, Jialin Meng, Jiajie Yu, Kangli Xu, Ruihong Yuan, Hao Zhu, Qingqing Sun, Shiyou Chen, David Wei Zhang, Lin Chen

Get full text

Artificial intelligence-driven phase stability evaluation and new dopants identification of hafnium oxide-based ferroelectric materials by Shaoan Yan, Pei Xu, Gang Li, Yuchun Li, Yingfang Zhu, Xiaona Zhu, Qiong Yang, Meng Li, Minghua Tang, Hongliang Lu, Sen Liu, Qingjiang Li, David Wei Zhang, Zhigang Chen

Get full text