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  1. 1
    Measuring error rates of mid-circuit measurements

    Measuring error rates of mid-circuit measurements by Daniel Hothem, Jordan Hines, Charles Baldwin, Dan Gresh, Robin Blume-Kohout, Timothy Proctor

    Published 2025-07-01
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  2. 2
    Qutrit toric code and parafermions in trapped ions

    Qutrit toric code and parafermions in trapped ions by Mohsin Iqbal, Anasuya Lyons, Chiu Fan Bowen Lo, Nathanan Tantivasadakarn, Joan Dreiling, Cameron Foltz, Thomas M. Gatterman, Dan Gresh, Nathan Hewitt, Craig A. Holliman, Jacob Johansen, Brian Neyenhuis, Yohei Matsuoka, Michael Mills, Steven A. Moses, Peter Siegfried, Ashvin Vishwanath, Ruben Verresen, Henrik Dreyer

    Published 2025-07-01
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