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  1. 1
    Nitridation Process Optimization of 4H-SiC Gate Oxidation

    Nitridation Process Optimization of 4H-SiC Gate Oxidation by CHEN Ximing, LI Chengzhan, ZHAO Yanli, DENG Xiaochuan, ZHANG Bo

    Published 2016-01-01
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  2. 2
    High-temperature Reliability of 1 200 V SiC Power MOSFETs

    High-temperature Reliability of 1 200 V SiC Power MOSFETs by DENG Xiaochuan, CHEN Xixi, WANG Yiyu, SHEN Huajun, TANG Yachao, GAO Yunbing

    Published 2016-01-01
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